Introduction to Scanning Tunneling Microscopy

Introduction to Scanning Tunneling Microscopy

Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York)

Oxford University Press

01/2016

488

Mole

Inglês

9780198754756

15 a 20 dias

The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.
PART I; PART II
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